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Electronics Testing |
» Cross sectional analysis
» Photomicrographs
» Failure mode & defect analysis
» Real-time X-Ray Radiography
» Adhesion/bond strength
» DPA Destructive physical analysis
» Packaging problems
» Shear strength
» Plating thickness
» Conductivity & resistivity
» Thermal cycling
» Visual inspections
» SEM/EDS and FTIR analysis
» Contamination analysis
» Wire bond pull tests
» Strain gaging
» Steam aging
» Solderability testing
» Thermal cycling
» Peel testing
» Tensile testing
» Dimensional verification
» Passive component failure
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CLARK AVENUE | SAINT LOUIS, MO 63103 | PHONE: 314-531-8080 | FAX: 314-531-8085 |